LOW-ABSORPTION MEASUREMENT OF OPTICAL THIN-FILMS USING THE PHOTOTHERMAL SURFACE-DEFORMATION TECHNIQUE

被引:13
|
作者
WELSCH, E
WALTHER, HG
ECKARDT, P
LAN, T
机构
关键词
D O I
10.1139/p88-106
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:638 / 644
页数:7
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