LOW-ABSORPTION MEASUREMENT OF OPTICAL THIN-FILMS USING THE PHOTOTHERMAL SURFACE-DEFORMATION TECHNIQUE

被引：13

|

作者：

WELSCH, E

WALTHER, HG

ECKARDT, P

LAN, T

机构：

来源：

CANADIAN JOURNAL OF PHYSICS | 1988年 / 66卷 / 07期

关键词：

D O I：

10.1139/p88-106

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：638 / 644

页数：7

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