MEASUREMENT OF THICKNESS OF THIN FILMS BY MODULATION POLARIMETRY

被引：0
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作者：
KARASEV, VV
LUZHNOV, YM
CHURAEV, NV
机构：
来源：
RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY,USSR | 1968年 / 42卷 / 02期
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中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
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页码：299 / &
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