共 50 条
- [41] MEASUREMENT OF PHASE OF THE TRANSMISSION FACTOR OF THIN METALLIC-FILMS ZHURNAL TEKHNICHESKOI FIZIKI, 1982, 52 (03): : 573 - 574
- [42] SPUTTERING PROCESSES OF ION-BOMBARDED ELECTRONIC MATERIALS ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1991, 202 : 43 - NUCL
- [43] TRIBOLOGY OF ION-BOMBARDED SILICON FOR MICROMECHANICAL APPLICATIONS JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME, 1993, 115 (03): : 392 - 399
- [44] Roughening and ripple instabilities on ion-bombarded Si PHYSICAL REVIEW B, 1996, 54 (24): : 17647 - 17653
- [45] ELECTROREFLECTION SPECTRA OF SURFACE OF ION-BOMBARDED SILICON SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 9 (04): : 460 - 464
- [46] ATOMIC MIGRATION AND TRAPPING IN ION-BOMBARDED METALS JOURNAL OF METALS, 1987, 39 (07): : A32 - A32
- [48] Molecular Dynamics Simulations of Ion-Bombarded Graphene JOURNAL OF PHYSICAL CHEMISTRY C, 2012, 116 (06): : 4044 - 4049
- [50] THE APPLICATION OF ENERGETIC ION-BEAMS TO THIN METALLIC-FILMS MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1990, 6 (2-3): : 205 - 210