INSTALLATION FOR THE MEASUREMENT OF THE ADHESION OF THIN-FILMS

被引：0
|
作者：
LABUNOV, VA
LESHCHENKO, IN
UVAROV, AR
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1978年 / 21卷 / 04期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1146 / 1147
页数：2
相关论文
共 50 条
  • [31] ON THE INTERFEROMETRIC MEASUREMENT OF THE THICKNESS OF VERY THIN-FILMS
    PROROK, VV
    SHAIKEVICH, IA
    OPTIKA I SPEKTROSKOPIYA, 1980, 49 (01): : 122 - 125
  • [32] MEASUREMENT OF ORGANIC VAPOR MIGRATION IN THIN-FILMS
    GILLETTE, PC
    TAPPI JOURNAL, 1988, 71 (03): : 193 - 198
  • [33] MEASUREMENT OF PIEZOELECTRIC COEFFICIENTS OF FERROELECTRIC THIN-FILMS
    LEFKI, K
    DORMANS, GJM
    JOURNAL OF APPLIED PHYSICS, 1994, 76 (03) : 1764 - 1767
  • [34] ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS
    HO, JH
    LEE, CL
    LEI, TF
    SOLID-STATE ELECTRONICS, 1988, 31 (08) : 1321 - 1326
  • [35] THICKNESS MEASUREMENT ON THIN-FILMS WITH UHF SIGNALS
    STERKHOV, VA
    TOKAREV, ND
    ZHARAVIN, AI
    MEASUREMENT TECHNIQUES, 1973, 16 (08) : 1151 - 1153
  • [36] REMOTE ULTRASONIC MEASUREMENT OF THE THICKNESS OF THIN-FILMS
    LEFEBVRE, JE
    BRUNEEL, C
    DELEBARRE, C
    LUTGEN, P
    ECKER, T
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 1988, 84 (03): : 1094 - 1096
  • [37] INSITU SENSITIVE MEASUREMENT OF STRESS IN THIN-FILMS
    LEUSINK, GJ
    OOSTERLAKEN, TGM
    JANSSEN, GCAM
    RADELAAR, S
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (05): : 3143 - 3146
  • [38] MEASUREMENT OF THE INTERFACIAL STRENGTH OF FIBERS AND THIN-FILMS
    SACHSE, W
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1990, 126 : 133 - 139
  • [39] HARDNESS AND ELASTICITY MEASUREMENT OF THIN-FILMS WITH NANOINDENTER
    YANAGISAWA, M
    JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS, 1995, 40 (03) : 199 - 204
  • [40] MEASUREMENT OF WEAK ABSORPTION IN OPTICAL THIN-FILMS
    JIN, SZ
    TANG, JF
    APPLIED OPTICS, 1987, 26 (12): : 2407 - 2409
12345