共 50 条
- [42] Ellipsometry measurement accuracy of gate oxides under polysilicon MICRO- AND NANOSYSTEMS, 2004, 782 : 147 - 152
- [47] NEAR-INFRARED REFLECTANCE SPECTROSCOPY .2. EFFECT OF CALIBRATION SET SELECTION ON ACCURACY OF METHOD JOURNAL OF THE ASSOCIATION OF OFFICIAL ANALYTICAL CHEMISTS, 1991, 74 (05): : 853 - 856