SURFACE-STRUCTURES OF COMPOUND SEMICONDUCTORS

被引:46
作者
DUKE, CB [1 ]
机构
[1] XEROX CORP, WEBSTER RES CTR, ROCHESTER, NY 14644 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1977年 / 14卷 / 04期
关键词
D O I
10.1116/1.569319
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:870 / 877
页数:8
相关论文
共 61 条
[51]   SYNCHROTRON RADIATION STUDIES OF ELECTRONIC-STRUCTURE AND SURFACE-CHEMISTRY OF GAAS, GASB, AND INP [J].
SPICER, WE ;
LINDAU, I ;
GREGORY, PE ;
GARNER, CM ;
PIANETTA, P ;
CHYE, PW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04) :780-785
[52]   PHOTOEMISSION STUDIES OF SURFACE AND INTERFACE STATES ON 3-5 COMPOUNDS [J].
SPICER, WE ;
CHYE, PW ;
GREGORY, PE ;
SUKEGAWA, T ;
BABALOLA, IA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01) :233-240
[53]   DEPENDENCE OF CRITICAL-TEMPERATURE FOR FORMATION OF CHARGE-DENSITY WAVES IN 2H-NBSE2 UPON IMPURITY CONCENTRATION [J].
STILES, JAR ;
WILLIAMS, DL ;
ZUCKERMANN, MJ .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1976, 9 (18) :L489-L493
[54]  
Tong S. Y., 1975, Progress in Surface Science, V7, P1, DOI 10.1016/0079-6816(75)90010-6
[55]   SURFACE-STRUCTURE DETERMINATION OF LAYERED COMPOUNDS MOS2 AND NBSE2 BY DYNAMICAL LEED APPROACH [J].
TONG, SY ;
VANHOVE, M ;
MRSTIK, BJ ;
KAPLAN, R ;
REINECKE, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01) :188-188
[56]   SURFACE-STRUCTURE DETERMINATION BY LOW-ENERGY ELECTRON-DIFFRACTION [J].
TUCKER, CW ;
DUKE, CB .
SURFACE SCIENCE, 1972, 29 (01) :237-&
[57]  
VANHOVE MA, TO BE PUBLISHED
[58]   CONTACT POTENTIAL DIFFERENCES FOR 3-5 COMPOUND SURFACES [J].
VANLAAR, J ;
HUIJSER, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04) :769-772
[59]   CHARGE-DENSITY WAVES IN METALLIC, LAYERED, TRANSITION-METAL DICHALCOGENIDES [J].
WILSON, JA ;
DISALVO, FJ ;
MAHAJAN, S .
PHYSICAL REVIEW LETTERS, 1974, 32 (16) :882-885
[60]  
Wyckoff R.W.G., 1963, CRYST STRUCT, VVolume 1