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- [2] Electronic characteristics of P-Si CoSi2/Si Schottky junction formed by high flux metal ion implantation Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics, 2005, 25 (01): : 98 - 101
- [5] STRUCTURE ANALYSIS OF CoSi2/Si1-xGex/Si(001) INTERFACES. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C460 - C460