SOME APPLICATIONS OF ION-BEAM SPUTTERING TO HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：17

|

作者：

HOJOU, K

OIKAWA, T

KANAYA, K

KIMURA, T

ADACHI, K

机构：

[1] KOGAKUIN UNIV, DEPT ELECT ENGN, SHINJUKU KU, TOKYO, JAPAN

[2] SNOW BRAND MILK PROD CO LTD, RES LAB, SAITAMA, JAPAN

[3] UNIV TOKYO, ENGN RES INST, BUNKYO KU, TOKYO 113, JAPAN

来源：

MICRON | 1977年 / 8卷 / 03期

关键词：

D O I：

10.1016/0047-7206(77)90020-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：151 / 170

页数：20

相关论文

共 50 条

[21] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SOME CATALYTIC PARTICLES
SANDERS, JV
CHEMICA SCRIPTA, 1979, 14 (1-5): : 141 - 145
[22] APPLICATIONS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY TO MATERIALS RESEARCH
HIRABAYASHI, M
TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS, 1988, 29 (03): : 171 - 182
[23] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SOME CARBONACEOUS MATERIALS
IIJIMA, S
JOURNAL OF MICROSCOPY-OXFORD, 1980, 119 (MAY): : 99 - 111
[24] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF SOME CATALYSTS
QIAO, GW
ZHOU, J
KUO, KH
ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1986, 41 (03): : 478 - 482
[25] HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1987, 38 : 57 - 88
[26] HIGH-RESOLUTION ELECTRON-MICROSCOPY
HASHIMOTO, H
ULTRAMICROSCOPY, 1984, 12 (1-2) : 90 - 90
[27] HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 463 - 477
[28] HIGH-RESOLUTION ION-BEAM LITHOGRAPHY
ECONOMOU, NP
FLANDERS, DC
DONNELLY, JP
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 1172 - 1175
[29] COMPARISON OF ION-BEAM SPUTTERED CHROMIUM AND IRIDIUM FILMS FOR ELECTRON-MICROSCOPY APPLICATIONS
CARDINALE, GF
CARLINO, VL
HOWITT, DG
SCANNING, 1993, 15 (01) : 25 - 30
[30] TRANSMISSION ELECTRON-MICROSCOPY OF ION-BEAM THINNED DENTIN
BOYDE, A
CELL AND TISSUE RESEARCH, 1974, 152 (04) : 543 - 550

← 1 2 3 4 5 →