ELECTRICAL CHARACTERIZATION OF ION-IMPLANTATION INTO GAAS - TOPOGRAPHY AND DEPTH PROFILES

被引:2
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作者
LOOK, DC
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D O I
10.1149/1.2100236
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O646 [电化学、电解、磁化学];
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081704 ;
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页码:2527 / 2533
页数:7
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