MINORITY-CARRIER LIFETIME MAPPING IN THE SEM

被引:5
|
作者
STECKENBORN, A
机构
来源
JOURNAL OF MICROSCOPY-OXFORD | 1980年 / 118卷 / MAR期
关键词
D O I
10.1111/j.1365-2818.1980.tb00276.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:297 / 302
页数:6
相关论文
共 50 条
  • [32] MINORITY-CARRIER LIFETIME IN III-V SEMICONDUCTORS
    AHRENKIEL, RK
    MINORITY CARRIERS IN III-V SEMICONDUCTORS: PHYSICS AND APPLICATIONS, 1993, 39 : 39 - 150
  • [33] Minority-carrier lifetime damage coefficient of irradiated InP
    Keyes, BM
    Ahrenkiel, RK
    Shaw, GJ
    Summers, GP
    JOURNAL OF APPLIED PHYSICS, 1997, 82 (05) : 2156 - 2163
  • [34] A simplified formulation for calculation of minority-carrier effective lifetime
    Li, Xiao-Xia
    He, Ji-Huan
    RESULTS IN PHYSICS, 2018, 11 : 623 - 624
  • [35] MINORITY-CARRIER LIFETIME IN GAAS THIN-FILMS
    AHRENKIEL, RK
    DUNLAVY, DJ
    BENNER, J
    GALE, RP
    MCCLELLAND, RW
    GORMLEY, JV
    KING, BD
    APPLIED PHYSICS LETTERS, 1988, 53 (07) : 598 - 599
  • [36] MEASUREMENT OF THE MINORITY-CARRIER LIFETIME USING AN MOS CAPACITOR
    WEI, CY
    WOODBURY, HH
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (05) : 957 - 964
  • [37] MINORITY-CARRIER LIFETIME MEASUREMENTS OF ALGAAS RED LEDS
    STERANKA, FM
    DEFEVERE, D
    CAMRAS, M
    RUDAZ, SL
    MCELFRESH, DK
    COOK, LW
    SNYDER, WL
    JOURNAL OF ELECTRONIC MATERIALS, 1988, 17 (04) : S16 - S16
  • [38] MINORITY-CARRIER LIFETIME IN ALXGA1-XAS
    AHRENKIEL, RK
    DUNLAVY, DJ
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 822 - 826
  • [39] MEASURED MINORITY-CARRIER LIFETIME AND CIGS DEVICE PERFORMANCE
    Repins, Ingrid L.
    Metzger, Wyatt K.
    Perkins, Craig L.
    Li, Jian V.
    Contreras, Miguel A.
    2009 34TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-3, 2009, : 2159 - 2164