HIGH-RESOLUTION AUGER-ELECTRON SPECTROSCOPY AND MICROSCOPY OF A SUPPORTED METAL CATALYST

被引：22
|
作者：
LIU, J
HEMBREE, GG
SPINNLER, GE
VENABLES, JA
机构：
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
[2] SHELL DEV CO,WESTHOLLOW RES CTR,HOUSTON,TX 77252
[3] UNIV SUSSEX,SCH MAPS,BRIGHTON BN1 9QH,E SUSSEX,ENGLAND
来源：
SURFACE SCIENCE | 1992年 / 262卷 / 03期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1016/0039-6028(92)90118-P
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
High spatial resolution Auger electron spectra and scanning Auger microscope (SAM) images of supported metal catalysts have been obtained in a UHV scanning transmission electron microscope. Ag/alpha-Al2O3 was used as a model catalyst system, where silver was evaporated, in situ, onto polycrystalline alumina carriers. Silver particles, as small as 2 nm in diameter, were clearly revealed in SAM images with high contrast. On large islands, an edge resolution < 3 nm was achieved. Information about surface and bulk properties of supported catalysts can be extracted from images formed with different signals generated from the same area which are obtained simultaneously.
引用
收藏
页码：L111 / L117
页数：7
相关论文
共 50 条
  • [41] OPTIMIZATION AND REDESIGN OF AN ELECTRON SPECTROMETER FOR HIGH-RESOLUTION GAS-PHASE UV PHOTOELECTRON, AUGER-ELECTRON, AND ION FRAGMENT SPECTROSCOPY
    BALTZER, P
    WANNBERG, B
    GOTHE, MC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (03): : 643 - 654
  • [42] HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY FOR THE CHARACTERIZATION OF SUPPORTED METAL-CATALYSTS
    SMITH, DJ
    YAO, MH
    ALLARD, LF
    DATYE, AK
    CATALYSIS LETTERS, 1995, 31 (01) : 57 - 64
  • [43] LEED AND AUGER-ELECTRON SPECTROSCOPY
    HAYAKAWA, K
    JOURNAL OF JAPAN SOCIETY OF LUBRICATION ENGINEERS, 1974, 19 (03): : 237 - 242
  • [44] INTRODUCTION TO AUGER-ELECTRON SPECTROSCOPY
    CALOW, JT
    JOURNAL OF SUBMICROSCOPIC CYTOLOGY AND PATHOLOGY, 1978, 10 (01) : 154 - 154
  • [45] BACKGROUND IN AUGER-ELECTRON SPECTROSCOPY
    LANGERON, JP
    VACUUM, 1988, 38 (11) : 1054 - 1054
  • [46] EFFECT OF INSTRUMENTAL RESOLUTION ON QUANTIFICATION IN AUGER-ELECTRON SPECTROSCOPY MEASUREMENTS
    MANY, A
    GOLDSTEIN, Y
    WEISZ, SZ
    RESTO, O
    VACUUM, 1990, 41 (7-9) : 1605 - 1607
  • [47] AUGER-ELECTRON SPECTROSCOPY - REVIEW
    JOHNSON, WC
    JOSHI, A
    STEIN, DF
    CANADIAN JOURNAL OF SPECTROSCOPY, 1972, 17 (03): : 88 - &
  • [48] APPLICATIONS OF AUGER-ELECTRON SPECTROSCOPY
    不详
    RESEARCH-DEVELOPMENT, 1973, 24 (07): : 36 - 38
  • [49] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY
    CAILLER, M
    GANACHAUD, JP
    ROPTIN, D
    ADVANCES IN ELECTRONINCS AND ELECTRON PHYSICS, 1983, 61 : 161 - 298
  • [50] DECONVOLUTION IN AUGER-ELECTRON SPECTROSCOPY
    CHORNIK, B
    BISHOP, HE
    LEMOEL, A
    LEGRESSUS, C
    SCANNING ELECTRON MICROSCOPY, 1986, 1986 : 77 - 88
12345