HIGH-RESOLUTION AUGER-ELECTRON SPECTROSCOPY AND MICROSCOPY OF A SUPPORTED METAL CATALYST

被引:22
|
作者
LIU, J
HEMBREE, GG
SPINNLER, GE
VENABLES, JA
机构
[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287
[2] SHELL DEV CO,WESTHOLLOW RES CTR,HOUSTON,TX 77252
[3] UNIV SUSSEX,SCH MAPS,BRIGHTON BN1 9QH,E SUSSEX,ENGLAND
基金
美国国家科学基金会;
关键词
D O I
10.1016/0039-6028(92)90118-P
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
High spatial resolution Auger electron spectra and scanning Auger microscope (SAM) images of supported metal catalysts have been obtained in a UHV scanning transmission electron microscope. Ag/alpha-Al2O3 was used as a model catalyst system, where silver was evaporated, in situ, onto polycrystalline alumina carriers. Silver particles, as small as 2 nm in diameter, were clearly revealed in SAM images with high contrast. On large islands, an edge resolution < 3 nm was achieved. Information about surface and bulk properties of supported catalysts can be extracted from images formed with different signals generated from the same area which are obtained simultaneously.
引用
收藏
页码:L111 / L117
页数:7
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