Stuck-at fault detection, controllability and observability functions of the combinational circuit gate pole

被引：0
|
作者：
Golubeva, Olga, I [1 ]
机构：
[1] Tomsk State Univ, Tomsk, Russia
来源：
VESTNIK TOMSKOGO GOSUDARSTVENNOGO UNIVERSITETA-UPRAVLENIE VYCHISLITELNAJA TEHNIKA I INFORMATIKA-TOMSK STATE UNIVERSITY JOURNAL OF CONTROL AND COMPUTER SCIENCE | 2015年 / 30卷 / 01期
关键词：
combinational circuit; stuck-at fault; test patterns; observability; BDD; orthogonal DNF;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：77 / 86
页数：10
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