共 50 条
- [42] Structure and spectroscopy of amorphous silicon dioxide at the silicon/silicon oxide interface. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 215 : U160 - U160
- [45] Polycrystalline silicon thin film prepared by aluminum-induced crystallization with native silicon oxide at the aluminum and silicon interface JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2009, 11 (08): : 1077 - 1081
- [46] CHARACTERISTICS OF A METAL OXIDE-SILICON STRUCTURE WITH A TUNNEL-TRANSPARENT INSULATING LAYER SOVIET PHYSICS SEMICONDUCTORS-USSR, 1981, 15 (10): : 1203 - 1205
- [50] Extraction of trap states at the oxide-silicon interface and grain boundary in polycrystalline silicon thin-film transistors JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (01): : 112 - 113