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- [21] MICROROUGHNESS MEASUREMENTS ON POLISHED SILICON-WAFERS JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (03): : 721 - 728
- [28] PHOTOACOUSTIC MEASUREMENTS OF DOPED SILICON-WAFERS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 114 (02): : 519 - 523
- [30] PARALLELISM IMPROVEMENT OF GROUND SILICON-WAFERS JOURNAL OF ENGINEERING FOR INDUSTRY-TRANSACTIONS OF THE ASME, 1991, 113 (01): : 25 - 28