A TEST PROGRAM GENERATOR FOR MEMORY-SYSTEMS

被引：0
|
作者：
SHIH, HJ
KER, JS
KUO, YH
机构：
[1] INST INFORMAT IND,DIV TECHNOL RES,TAIPEI,TAIWAN
[2] NATL CHENG KUNG UNIV,INST INFORMAT ENGN,DEPT ELECT ENGN,TAINAN 70101,TAIWAN
来源：
JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS | 1994年 / 17卷 / 02期
关键词：
MEMORY SYSTEM TESTING; FAULT DETECTION; FAULT ISOLATION;
D O I：
10.1080/02533839.1994.9677581
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
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页码：179 / 191
页数：13
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