A TEST PROGRAM GENERATOR FOR MEMORY-SYSTEMS

被引：0

作者：

SHIH, HJ

KER, JS

KUO, YH

机构：

[1] INST INFORMAT IND,DIV TECHNOL RES,TAIPEI,TAIWAN

[2] NATL CHENG KUNG UNIV,INST INFORMAT ENGN,DEPT ELECT ENGN,TAINAN 70101,TAIWAN

来源：

JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS | 1994年 / 17卷 / 02期

关键词：

MEMORY SYSTEM TESTING; FAULT DETECTION; FAULT ISOLATION;

D O I：

10.1080/02533839.1994.9677581

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.

引用

页码：179 / 191

页数：13

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