MEMORY SYSTEM TESTING;
FAULT DETECTION;
FAULT ISOLATION;
D O I:
10.1080/02533839.1994.9677581
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
机构:
Inst for information Industry, Taipei, TaiwanInst for information Industry, Taipei, Taiwan
Shih, Hung-Ju
Ker, Jar-Shone
论文数: 0引用数: 0
h-index: 0
机构:
Inst for information Industry, Taipei, TaiwanInst for information Industry, Taipei, Taiwan
Ker, Jar-Shone
Kuo, Yau-Hwang
论文数: 0引用数: 0
h-index: 0
机构:
Inst for information Industry, Taipei, TaiwanInst for information Industry, Taipei, Taiwan
Kuo, Yau-Hwang
Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an,
1994,
17
(02):
: 179
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191