A TEST PROGRAM GENERATOR FOR MEMORY-SYSTEMS

被引:0
|
作者
SHIH, HJ
KER, JS
KUO, YH
机构
[1] INST INFORMAT IND,DIV TECHNOL RES,TAIPEI,TAIWAN
[2] NATL CHENG KUNG UNIV,INST INFORMAT ENGN,DEPT ELECT ENGN,TAINAN 70101,TAIWAN
关键词
MEMORY SYSTEM TESTING; FAULT DETECTION; FAULT ISOLATION;
D O I
10.1080/02533839.1994.9677581
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A set of algorithms which can be used to detect and locate the faults in a given memory system, and a test program generator which automatically produces test programs according to the algorithms which are used by the memory system to be tested are developed. Furthermore, a fault simulator designed to simulate the faulty behavior of a memory system has been developed to evaluate the effectiveness of the test program in covering faults. Results showed that a fault coverage near 100% could be achieved.
引用
收藏
页码:179 / 191
页数:13
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