ADVANCED HIGH-CURRENT ECR ION SOURCES FOR IMPLANTERS

被引:13
|
作者
TORII, Y
SHIMADA, M
WATANABE, I
机构
[1] NTT LSI Laboratories, Atsugi-shi, Kanagawa-pref. 243-01
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 04期
关键词
D O I
10.1063/1.1142888
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have already introduced a high-current ECR ion source producing a 200-mA beam of oxygen ions with an 80% O+ fraction. Two more advanced ECR sources with a high-current density of more than 100 mA/cm2 have been newly developed. One source provides high-current density without the accompanying damage to the microwave transmitting window found with the earlier source. This damage, which occurs when high-speed backstream electrons attack the window, limits source lifetime. By adopting a multiple microwave inlet configuration for the introduction of microwaves into the plasma chamber, the ECR condition can be satisfied and high-density plasma can be generated without an attack by backstream electrons. The other is a very compact source producing a high-current beam at a very low-power consumption. This is achieved by reducing the inner diameter of the plasma chamber to 5 cm diameter, which is smaller than the cutoff dimensions for propagation of the 2.45 GHz microwave. A high-plasma density of 1 x 10(13) cm-3 has been obtained at the low microwave power of 250 W.
引用
收藏
页码:2559 / 2561
页数:3
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