ADVANCED HIGH-CURRENT ECR ION SOURCES FOR IMPLANTERS

被引:13
|
作者
TORII, Y
SHIMADA, M
WATANABE, I
机构
[1] NTT LSI Laboratories, Atsugi-shi, Kanagawa-pref. 243-01
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 04期
关键词
D O I
10.1063/1.1142888
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have already introduced a high-current ECR ion source producing a 200-mA beam of oxygen ions with an 80% O+ fraction. Two more advanced ECR sources with a high-current density of more than 100 mA/cm2 have been newly developed. One source provides high-current density without the accompanying damage to the microwave transmitting window found with the earlier source. This damage, which occurs when high-speed backstream electrons attack the window, limits source lifetime. By adopting a multiple microwave inlet configuration for the introduction of microwaves into the plasma chamber, the ECR condition can be satisfied and high-density plasma can be generated without an attack by backstream electrons. The other is a very compact source producing a high-current beam at a very low-power consumption. This is achieved by reducing the inner diameter of the plasma chamber to 5 cm diameter, which is smaller than the cutoff dimensions for propagation of the 2.45 GHz microwave. A high-plasma density of 1 x 10(13) cm-3 has been obtained at the low microwave power of 250 W.
引用
收藏
页码:2559 / 2561
页数:3
相关论文
共 50 条
  • [21] VERY HIGH-CURRENT ECR ION-SOURCE FOR AN OXYGEN ION IMPLANTER
    TORII, Y
    SHIMADA, M
    WATANABE, I
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 21 (2-4): : 178 - 181
  • [22] ANALYSIS TECHNIQUES OF CHARGING DAMAGE STUDIED ON 3 DIFFERENT HIGH-CURRENT ION IMPLANTERS
    FELCH, SB
    LARSON, LA
    CURRENT, MI
    LINDSEY, DW
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 37-8 : 563 - 567
  • [23] ENERGETIC NEUTRAL CONTAMINATION IN MODERN HIGH-CURRENT IMPLANTERS
    CHEREKDJIAN, S
    WEISENBERGER, W
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 55 (1-4): : 30 - 34
  • [24] Enhanced dosimetry for single wafer high-current implanters
    Scheuer, J. T.
    Dzengeleski, J.
    Distaso, D.
    Timberlake, D.
    Cummings, J.
    Olson, J. C.
    ION IMPLANTATION TECHNOLOGY, 2006, 866 : 405 - +
  • [25] HIGH-CURRENT NEGATIVE-ION SOURCES (INVITED)
    EHLERS, KW
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (01): : 662 - 664
  • [26] HIGH-CURRENT DC MICROWAVE ION SOURCES (INVITED)
    TAYLOR, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (04): : 2507 - 2512
  • [27] LEBT Development for High-Current Multicharged Ion Injector Based on SC ECR Ion Source
    A. V. Ziiatdinova
    P. A. Fedin
    T. V. Kulevoy
    A. A. Malishev
    S. L. Bogomolov
    A. A. Efremov
    Physics of Atomic Nuclei, 2022, 85 : 1535 - 1540
  • [28] LEBT Development for High-Current Multicharged Ion Injector Based on SC ECR Ion Source
    Ziiatdinova, A. V.
    Fedin, P. A.
    Kulevoy, T. V.
    Malishev, A. A.
    Bogomolov, S. L.
    Efremov, A. A.
    PHYSICS OF ATOMIC NUCLEI, 2022, 85 (09) : 1535 - 1540
  • [29] GATE OXIDES IN HIGH-CURRENT IMPLANTERS - HOW DO THEY SURVIVE
    SINCLAIR, F
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 55 (1-4): : 115 - 123
  • [30] MAGNET DESIGN FOR HIGH-CURRENT IMPLANTERS OR SMALL ISOTOPE SEPARATORS
    KELLER, JH
    HICKS, WW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06): : 1921 - 1924