COMPUTER-AIDED MEASUREMENT, BY A STYLUS, OF SURFACES WITH DOUBLE CONTOUR

被引：0

作者：

PASQUINO, R

机构：

来源：

JOURNAL OF ENGINEERING FOR INDUSTRY-TRANSACTIONS OF THE ASME | 1991年 / 113卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

This paper deals with computer aided measurements by a "stylus" of doubly contoured surfaces. The main result consists in the proposal of suitable algorithms, to be implemented on a personal computer, to efficiently correct the measurement errors involved by the geometry of the stylus.

引用

页码：479 / 481

页数：3

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