COMPUTER-AIDED MEASUREMENT, BY A STYLUS, OF SURFACES WITH DOUBLE CONTOUR

被引：0
|
作者：
PASQUINO, R
机构：
来源：
JOURNAL OF ENGINEERING FOR INDUSTRY-TRANSACTIONS OF THE ASME | 1991年 / 113卷 / 04期
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D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
This paper deals with computer aided measurements by a "stylus" of doubly contoured surfaces. The main result consists in the proposal of suitable algorithms, to be implemented on a personal computer, to efficiently correct the measurement errors involved by the geometry of the stylus.
引用
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页码：479 / 481
页数：3
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