CHARACTERIZATION OF INTERFACIAL ATOMIC STEPS IN GAAS/AIAS SUPERLATTICES BY TRANSMISSION ELECTRON-MICROSCOPY

被引：13
|
作者：
NAKAMURA, T
IKEDA, M
MUTO, S
UMEBU, I
机构：
来源：
APPLIED PHYSICS LETTERS | 1988年 / 53卷 / 05期
关键词：
D O I：
10.1063/1.99899
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：379 / 381
页数：3
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