FILM STRESS IN HIGH-DENSITY THIN-FILM INTERCONNECT

被引:5
|
作者
PAN, JT
POON, S
机构
关键词
D O I
10.1557/PROC-154-27
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:27 / 37
页数:11
相关论文
共 50 条
  • [41] High-density multi-layer thin-film packaging technology for high-performance ASIC chips
    Kikuchi, K
    Shimoto, T
    Honda, H
    Kata, K
    Matsui, K
    Morishige, S
    2001 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 2001, 4587 : 242 - 247
  • [42] Bicrystal advanced thin-film media for high density recording
    Min, Tai
    Zhu, Jian-Gang
    1600, American Inst of Physics, Woodbury, NY, USA (75):
  • [43] High-density neural recordings from feline sacral dorsal root ganglia with thin-film array
    Sperry, Zachariah J.
    Na, Kyounghwan
    Jun, James
    Madden, Lauren R.
    Socha, Alec
    Yoon, Eusik
    Seymour, John P.
    Bruns, Tim M.
    JOURNAL OF NEURAL ENGINEERING, 2021, 18 (04)
  • [44] HIGH-DENSITY PROBE WITH INTEGRATED THIN-FILM MICRO LIGHT EMITTING DIODES (μLEDs) FOR OPTOGENETIC APPLICATIONS
    Ayub, Suleman
    Gossler, Christian
    Schwaerzle, Michael
    Klein, Eric
    Paul, Oliver
    Schwarz, Ulrich T.
    Ruther, Patrick
    2016 IEEE 29TH INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS (MEMS), 2016, : 379 - 382
  • [45] A Study on Broadband Switching Noise Reduction by Embedding High-Density Thin-Film Capacitor In a Laminate Package
    Kaneko, Satoshi
    Takahahsi, Yo
    Sudo, Toshio
    Kanno, Akihiro
    Sugimmoto, Akiko
    Kuwako, Fujio
    IEEE EDAPS: 2008 ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM, 2008, : 73 - +
  • [46] STRESS EFFECTS ON THIN-FILM PARAMETRONS
    ULZURRUN, ET
    IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS, 1966, EC15 (04): : 647 - &
  • [47] DIFFRACTOMETER MEASURES THIN-FILM STRESS
    不详
    PHOTONICS SPECTRA, 1994, 28 (12) : 124 - 124
  • [48] Effects of Ir electrodes on barium strontium titanate thin-film capacitors for high-density memory application
    Chen, TS
    Balu, V
    Katakam, S
    Lee, JH
    Lee, JC
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (12) : 2304 - 2310
  • [49] Plasticity contributions to interface adhesion in thin-film interconnect structures
    Michael Lane
    Reinhold H. Dauskardt
    Anna Vainchtein
    Huajian Gao
    Journal of Materials Research, 2000, 15 : 2758 - 2769
  • [50] Plasticity contributions to interface adhesion in thin-film interconnect structures
    Lane, M
    Dauskardt, RH
    Vainchtein, A
    Gao, HJ
    JOURNAL OF MATERIALS RESEARCH, 2000, 15 (12) : 2758 - 2769