PERMANENT RADIATION EFFECTS IN COMPLEMENTARY-SYMMETRY MOS INTEGRATED CIRCUITS

被引：7
|
作者：
POCH, W
HOLMESSI.AG
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1969年 / NS16卷 / 06期
关键词：
D O I：
10.1109/TNS.1969.4325531
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：227 / +
页数：1
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