PERFORMANCE OF A FIELD-EMISSION GUN SCANNING ELECTRON-MICROSCOPE COLUMN

被引：27
|
作者：
VENABLES, JA
JANSSEN, AP
机构：
来源：
ULTRAMICROSCOPY | 1980年 / 5卷 / 03期
关键词：
D O I：
10.1016/0304-3991(80)90034-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：297 / 315
页数：19
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