PERFORMANCE OF A FIELD-EMISSION GUN SCANNING ELECTRON-MICROSCOPE COLUMN

被引：27

|

作者：

VENABLES, JA

JANSSEN, AP

机构：

来源：

ULTRAMICROSCOPY | 1980年 / 5卷 / 03期

关键词：

D O I：

10.1016/0304-3991(80)90034-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

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页码：297 / 315

页数：19

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