100-KV FIELD-EMISSION ELECTRON-MICROSCOPE

被引：0
|
作者：
GOTO, T [1 ]
HARADA, Y [1 ]
SOMEYA, T [1 ]
机构：
[1] JAPAN ELECTR OPTICS LAB LTD,ELECTR OPTICS DIV,TOKYO,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：282 / 282
页数：1
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