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- [2] A PRECISE AND SIMPLE METHOD, THE RELATIVE TRANSMISSION FRINGE DEPTH METHOD, OF DETERMINING THE OPTICAL-CONSTANTS AND THICKNESS OF THIN SEMITRANSPARENT FILMSJOURNAL OF PHYSICS D-APPLIED PHYSICS, 1992, 25 (06) : 1004 - 1009ZHANG, YPZHOU, CAGE, XSLIANG, XG
- [3] A METHOD FOR DETERMINING OPTICAL CONSTANTS AND THICKNESS OF DIELECTRIC FILMSOPTICS AND SPECTROSCOPY-USSR, 1969, 26 (02): : 162 - &GISIN, MAKONYUKHO.GPNESMELOV, EA
- [4] Method for determining the optical constants of films on absorbing substratesJOURNAL OF OPTICAL TECHNOLOGY, 2018, 85 (10) : 651 - 655Kotlikov, E. N.Novikova, Yu. A.Yurkovets, E. V.
- [5] Method of determining the optical constants of absorbing films: substrates with no absorptionJOURNAL OF OPTICAL TECHNOLOGY, 2018, 85 (01) : 48 - 52Kotlikov, E. N.Yurkovets, E. V.
- [6] A method for determining thickness and optical constants of absorbing thin filmsTHIN SOLID FILMS, 2003, 425 (1-2) : 203 - 209Pekker, DPekker, L
- [8] Determining the optical constants of thin oxide filmsJOURNAL OF OPTICAL TECHNOLOGY, 2006, 73 (08) : 548 - 554Barybin, A. A.Mezenov, A. V.Shapovalov, V. I.
- [9] A new method of determining the optical constants of metals, and the optical constants of siliconPHYSICAL REVIEW, 1910, 31 (05): : 489 - 499Ingersoll, LRLittleton, JT
- [10] OPTICAL METHOD OF MEASURING THE THICKNESS OF TRANSPARENT AND SEMITRANSPARENT FILMSINSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1982, 25 (02) : 496 - 497KASHIRSKII, IMBULYSHEV, YSSINITSKII, VV