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- [1] A method for determining thickness and optical constants of absorbing thin filmsTHIN SOLID FILMS, 2003, 425 (1-2) : 203 - 209Pekker, DPekker, L
- [2] Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectraJOURNAL OF PHYSICS D-APPLIED PHYSICS, 2001, 34 (16) : 2489 - 2496Ruíz-Pérez, JJGonzález-Leal, JMMinkov, DAMárquez, E
- [3] ELLIPSOMETRIC METHOD OF DETERMINING THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON FILMSINDUSTRIAL LABORATORY, 1989, 55 (08): : 949 - 951MUKHINA, EGSMIRNOVA, EIKHARINA, ILANUFRIEVA, TVROOT, SV
- [4] Analytical method for determining optical constants and thickness of absorbing films from absorption spectraOptics and Spectroscopy (English translation of Optika i Spektroskopiya), 1995, 78 (05):Filippov, V.V.
- [5] METHOD FOR DETERMINING OPTICAL CONSTANTS OF SEMITRANSPARENT FILMSAPPLIED OPTICS, 1971, 10 (02): : 338 - &WEBBER, SESCHARBER, SR
- [6] METHODS FOR DETERMINING FILM THICKNESS AND OPTICAL CONSTANTS OF FILMS AND SUBSTRATESJOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (03) : 351 - +RUIZURBIETA, MSPARROW, EMECKERT, ERG
- [7] Method for determining the optical constants of films on absorbing substratesJOURNAL OF OPTICAL TECHNOLOGY, 2018, 85 (10) : 651 - 655Kotlikov, E. N.Novikova, Yu. A.Yurkovets, E. V.
- [8] VARIATION OF OPTICAL OR DIELECTRIC CONSTANTS OF THIN PULVERIZED FILMS AS FUNCTION OF THEIR THICKNESSTHIN SOLID FILMS, 1970, 6 (05) : R53 - +PERNY, GLAVIELLE, LSANCIER, JP
- [9] ANALYTICAL METHOD FOR DETERMINING OPTICAL-CONSTANTS AND THICKNESS OF ABSORBING FILMS FROM ABSORPTION-SPECTRAOPTIKA I SPEKTROSKOPIYA, 1995, 78 (05): : 798 - 801FILIPPOV, VV
- [10] CORRECTION METHOD FOR DETERMINING THE OPTICAL-CONSTANTS OF THIN-FILMS WITH NON-UNIFORM THICKNESSTHIN SOLID FILMS, 1984, 116 (1-3) : 235 - 239TOROK, MIMICHAILOVITS, LHEVESI, I