STRUCTURAL CHARACTERIZATION OF THE SI(111)-CAF2 INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：15

作者：

TROMP, RM ^{[1
]}

LEGOUES, FK ^{[1
]}

KRAKOW, W ^{[1
]}

SCHOWALTER, LJ ^{[1
]}

机构：

[1] RENSSELAER POLYTECH INST,CTR INTEGRATED ELECTR,TROY,NY 12181

来源：

PHYSICAL REVIEW LETTERS | 1988年 / 61卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.61.2274

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：2274 / 2274

页数：1

共 50 条

[21] IMAGING OF THE SILICON ON SAPPHIRE INTERFACE BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
PONCE, FA
ARANOVICH, J
APPLIED PHYSICS LETTERS, 1981, 38 (06) : 439 - 441
[22] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF THE AG/MGO INTERFACE
TRAMPERT, A
ERNST, F
FLYNN, CP
FISCHMEISTER, HF
RUHLE, M
ACTA METALLURGICA ET MATERIALIA, 1992, 40 (SUPPL): : S227 - S236
[23] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF SI/GE INTERFACIAL STRUCTURES
IKARASHI, N
TATSUMI, T
ISHIDA, K
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (3A): : 1228 - 1233
[24] SURFACE AND INTERFACE PHONONS OF CAF2 EPITAXIAL LAYERS ON SI(111) MEASURED BY HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY
LONGUEVILLE, JL
THIRY, PA
CAUDANO, R
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 1670 - 1675
[25] Atomic structure of CaF2/Si(111) interface and defect formation on CaF2(111) surface by electron irradiation
Miura, Kouji, 1600, (30):
[26] BENEFITS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY FOR THE STRUCTURAL CHARACTERIZATION OF MULLITES
EPICIER, T
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1991, 74 (10) : 2359 - 2366
[27] STRUCTURE OF THE SI(111)/CAF2 INTERFACE
TROMP, RM
REUTER, MC
LEGOUES, FK
KRAKOW, W
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1910 - 1913
[28] STRUCTURE OF THE SI(111)-CAF2 INTERFACE
TROMP, RM
REUTER, MC
PHYSICAL REVIEW LETTERS, 1988, 61 (15) : 1756 - 1759
[29] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF HETEROSTRUCTURES
CERVA, H
SOLID-STATE ELECTRONICS, 1994, 37 (4-6) : 1045 - 1052
[30] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY (HRTEM)
GRUEHN, R
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (07): : 781 - 781

← 1 2 3 4 5 →