MEASUREMENT OF LIFETIME OF HIGH-DENSITY PLASMA IN SEMICONDUCTOR

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作者：
ARIZUMI, T
UMENO, M
HORIBA, Y
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ELECTRONICS & COMMUNICATIONS IN JAPAN | 1967年 / 50卷 / 01期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：90 / &
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