A SIMPLE MICROWAVE INTERFEROMETER FOR MEASURING EFFECTIVE THICKNESS OF DIELECTRIC SLABS

被引：5
|
作者：
ASHKENAZY, Y
LEVINE, E
TREVES, D
机构：
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1981年 / 30卷 / 04期
关键词：
D O I：
10.1109/TIM.1981.6312399
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：243 / 247
页数：5
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