A SIMPLE MICROWAVE INTERFEROMETER FOR MEASURING EFFECTIVE THICKNESS OF DIELECTRIC SLABS

被引：5

|

作者：

ASHKENAZY, Y

LEVINE, E

TREVES, D

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1981年 / 30卷 / 04期

关键词：

D O I：

10.1109/TIM.1981.6312399

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：243 / 247

页数：5

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