FCBM - A FIELD-INDUCED CHARGED-BOARD MODEL FOR ELECTROSTATIC DISCHARGES

被引:16
|
作者
LIN, DL
机构
[1] AT&T Bell Labs
关键词
D O I
10.1109/28.259711
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper addresses a test method for the evaluation of electronic subassemblies against the threat of electrostatic discharges (ESD). It describes a field-induced charged board model (FCBM) for the simulation of real world ESD. Experiment is designed to observe and measure ESD current waveforms. An analytic theory is developed to describe important fundamental processes of the ESD phenomenon. The application of the theory to the FCBM ESD predicts waveform characteristics in excellent agreement with the experiment. A recommendation for the specification of the ESD waveform is offered for inclusion in future ESD test standards of electronic subassemblies.
引用
收藏
页码:1047 / 1052
页数:6
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