PATENT STATISTICS AS A MEASURE OF TECHNICAL CHANGE

被引：229
|
作者：
COMANOR, WS
SCHERER, FM
机构：
[1] STANFORD UNIV,STANFORD,CA
[2] UNIV MICHIGAN,ANN ARBOR,MI
来源：
JOURNAL OF POLITICAL ECONOMY | 1969年 / 77卷 / 03期
关键词：
D O I：
10.1086/259522
中图分类号：
F [经济];
学科分类号：
02 ;
摘要：
引用
收藏
页码：392 / 398
页数：7
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