DIFFERENTIAL LASER INTERFEROMETER FOR NANOMETER DISPLACEMENT MEASUREMENTS

被引:17
|
作者
LEE, CK [1 ]
WU, TW [1 ]
机构
[1] IBM CORP,ALMADEN RES CTR,DIV RES,DEPT K64803,SAN JOSE,CA 95120
关键词
Instrumentation;
D O I
10.2514/3.12709
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
A dual beam differential laser interferometer/vibrometer measurement system was developed for studying the steady-state and dynamic behavior of low-weight high-performance mechanical systems. This newly developed optical system employs many optical and mechanical design tactics to achieve design targets such as nanometer displacement accuracy, ease of use, capability of measuring untreated structural surfaces, high-measurement bandwidths, and large-dynamic ranges. Both the optical/mechanical configurations and the design approaches adopted are discussed in detail. A flying slider and thin-film disk system currently used in the disk drive industry were used as the testbed to verify the capabilities of this newly developed nanometer structural displacement/velocity measurement system.
引用
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页码:1675 / 1680
页数:6
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