NON-DESTRUCTIVE MEASUREMENT OF A DIELECTRIC LAYER USING SURFACE ELECTROMAGNETIC-WAVES

被引：0
|
作者：
OU, W
GARDNER, CG
LONG, SA
机构：
[1] WELEX INC,HOUSTON,TX
[2] UNIV HOUSTON,DEPT ELECT ENGN,HOUSTON,TX 77004
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1983年 / 31卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：255 / 261
页数：7
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