FILM DENSITY-MEASUREMENT USING X-RAY MICROANALYSIS ON SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
KONIG, R [1 ]
SEND, W [1 ]
ALBERT, L [1 ]
机构：
[1] UNIV KARLSRUHE,LAB ELEKTR MIKROSKOPIE,KARLSRUHE,WEST GERMANY
来源：
MIKROSKOPIE | 1973年 / 28卷 / 11-1期
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：347 / 347
页数：1
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