FILM DENSITY-MEASUREMENT USING X-RAY MICROANALYSIS ON SCANNING ELECTRON-MICROSCOPE

被引:0
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作者
KONIG, R [1 ]
SEND, W [1 ]
ALBERT, L [1 ]
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[1] UNIV KARLSRUHE,LAB ELEKTR MIKROSKOPIE,KARLSRUHE,WEST GERMANY
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TH742 [显微镜];
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页码:347 / 347
页数:1
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