共 50 条
- [41] ON THE ROLE OF MASS-TRANSPORT BY POINT-DEFECT MOTION IN MICROIDENTATION FIZIKA TVERDOGO TELA, 1988, 30 (03): : 760 - 764
- [45] Laplace-transform deep-level spectroscopy: The technique and its applications to the study of point defects in semiconductors Dobaczewski, L. (dobacz@ifpan.edu.pl), 1600, American Institute of Physics Inc. (96):
- [48] APPLICATION OF DEEP-LEVEL TRANSIENT SPECTROSCOPY FOR MONITORING POINT-DEFECTS IN III-V SEMICONDUCTORS MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1993, 20 (1-2): : 221 - 224
- [49] Deep-level transient conductance spectroscopy of high resistivity semiconductors Physica Status Solidi C - Conferences and Critical Reviews, Vol 2, No 4, 2005, 2 (04): : 1347 - 1354
- [50] ELECTRONIC-STRUCTURE OF SIMPLE DEEP-LEVEL DEFECTS IN SEMICONDUCTORS FESTKORPERPROBLEME-ADVANCES IN SOLID STATE PHYICS, 1982, 22 : 115 - 148