MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE

被引:511
|
作者
BURNHAM, NA
COLTON, RJ
机构
关键词
D O I
10.1116/1.576168
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:2906 / 2913
页数:8
相关论文
共 50 条
  • [31] Local study of adhesive properties of viscoelastic materials using an atomic force microscope
    Basire, C
    Fretigny, C
    COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE II FASCICULE B-MECANIQUE PHYSIQUE CHIMIE ASTRONOMIE, 1997, 325 (04): : 211 - 220
  • [32] PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE
    BURNHAM, NA
    DOMINGUEZ, DD
    MOWERY, RL
    COLTON, RJ
    PHYSICAL REVIEW LETTERS, 1990, 64 (16) : 1931 - 1934
  • [33] SOLVATION FORCES NEAR A GRAPHITE SURFACE MEASURED WITH AN ATOMIC FORCE MICROSCOPE
    OSHEA, SJ
    WELLAND, ME
    RAYMENT, T
    APPLIED PHYSICS LETTERS, 1992, 60 (19) : 2356 - 2358
  • [34] Measuring the interaction forces between protein inclusion bodies and an air bubble using an atomic force microscope
    Wangsa-Wirawan, ND
    Ikai, A
    O'Neill, BK
    Middelberg, APJ
    BIOTECHNOLOGY PROGRESS, 2001, 17 (05) : 963 - 969
  • [35] Measuring the elastic properties of living cells by the atomic force microscope
    Radmacher, M
    ATOMIC FORCE MICROSCOPY IN CELL BIOLOGY, 2002, 68 : 67 - 90
  • [36] Measuring the viscoelastic properties of human platelets with the atomic force microscope
    Radmacher, M
    Fritz, M
    Kacher, CM
    Cleveland, JP
    Hansma, PK
    BIOPHYSICAL JOURNAL, 1996, 70 (01) : 556 - 567
  • [37] Comparison of friction measurements using the atomic force microscope and the surface forces apparatus: the issue of scale
    Patricia M. McGuiggan
    Jun Zhang
    Stephen M. Hsu
    Tribology Letters, 2001, 10 : 217 - 223
  • [38] Comparison of friction measurements using the atomic force microscope and the surface forces apparatus: the issue of scale
    McGuiggan, PM
    Zhang, J
    Hsu, SM
    TRIBOLOGY LETTERS, 2001, 10 (04) : 217 - 223
  • [39] Measuring energies with an Atomic Force Microscope
    Langer, J
    Díez-Pérez, I
    Sanz, F
    Fraxedas, J
    EUROPHYSICS LETTERS, 2006, 74 (01): : 110 - 116
  • [40] MEASUREMENT OF NANOMECHANICAL PROPERTIES OF THIN FILMS BY INTEGRATING NANOINDENTATION SYSTEM AND ATOMIC FORCE MICROSCOPE
    Chao, Lu-Ping
    Hsu, Joing-Shiun
    Lau, Yung-Dong
    INTERNATIONAL JOURNAL OF NANOSCIENCE, 2007, 6 (01) : 57 - 64