DIRECTION-SENSITIVE DISPLACEMENT ANALYSIS BY MULTIPLE FREQUENCY HOLOGRAPHIC-INTERFEROMETRY

被引：4

作者：

HOLLOWAY, DC ^{[1
]}

PATACCA, AM ^{[1
]}

FOURNEY, WL ^{[1
]}

机构：

[1] WESTINGHOUSE ELECT CORP,CTR DEF & ELECTR SYST,BALTIMORE,MD 21203

来源：

APPLIED OPTICS | 1978年 / 17卷 / 08期

关键词：

D O I：

10.1364/AO.17.001213

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1213 / 1219

页数：7

共 50 条

[41] THE APPLICATION OF HOLOGRAPHIC-INTERFEROMETRY TO THE ANALYSIS OF COMPOSITE-MATERIALS STRUCTURE
KREPELKOVA, H
OPTICA APPLICATA, 1980, 10 (02) : 91 - 97
[42] HOLOGRAPHIC-INTERFEROMETRY OF A PLASMA DURING FREQUENCY-CONVERSION THROUGH THE RADIATION PLASMA
ALUM, KP
KOVALCHUK, YV
OSTROVSKAYA, GV
ZHURNAL TEKHNICHESKOI FIZIKI, 1981, 51 (08): : 1618 - 1623
[43] MULTIPLE APERTURE HOLOGRAPHIC-INTERFEROMETRY AND ITS APPLICATION TO THE MEASUREMENT OF PLANT-MOVEMENT
KAKUNAI, S
IWATA, K
NAGATA, B
HASEGAWA, M
APPLIED OPTICS, 1986, 25 (10): : 1638 - 1641
[44] INCREASE OF HOLOGRAPHIC-INTERFEROMETRY SENSITIVITY BY MULTIPLE FLOW OF THE REDUCING EMISSION THROUGH THE HOLOGRAM
KOMISSAROVA, II
OSTROVSKAYA, GV
FILIPPOV, VN
SHEDOVA, EN
ZHURNAL TEKHNICHESKOI FIZIKI, 1987, 57 (02): : 377 - 380
[45] DETERMINATION OF 3-D DISPLACEMENT AND STRAIN BY HOLOGRAPHIC-INTERFEROMETRY FOR NON-PLANE OBJECTS
DANDLIKER, R
THALMANN, R
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1983, 398 : 11 - 16
[46] DETERMINATION OF DISPLACEMENT VECTORS BY MEANS OF HOLOGRAPHIC-INTERFEROMETRY AT A REDUCED NUMBER OF GEOMETRIC MAGNITUDES TO PC MEASURED
SCHREIBER, W
WENKE, L
OSTEN, W
OPTICA ACTA, 1981, 28 (09): : 1163 - 1167
[47] DETERMINATION OF DISPLACEMENT OF HOLE PROFILE IN CYLINDRICAL-SHELLS SUBJECTED TO TORSION USING HOLOGRAPHIC-INTERFEROMETRY
BALALOV, VV
PISAREV, VS
SHCHEPINOV, VP
YAKOVLEV, VV
SOVIET APPLIED MECHANICS, 1988, 24 (07): : 688 - 692
[48] MEASUREMENT OF THE ROTATION AND TRANSLATION OF DIFFUSELY REFLECTING OBJECTS BY TUNING THE DIRECTION OF RECONSTRUCTING BEAM IN HOLOGRAPHIC-INTERFEROMETRY
CHANG, MW
WEI, HD
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (10) : 1456 - 1456
[49] STRESS-ANALYSIS OF THIN POLYIMIDE FILMS USING HOLOGRAPHIC-INTERFEROMETRY
MADEN, MA
FARRIS, RJ
EXPERIMENTAL MECHANICS, 1991, 31 (02) : 178 - 184
[50] LINEARIZATION AND FLATTENING TECHNIQUE FOR FRINGE ANALYSIS AND ITS APPLICATION TO HOLOGRAPHIC-INTERFEROMETRY
SHILOH, K
SAYA, A
NDT INTERNATIONAL, 1988, 21 (06): : 446 - 452

← 1 2 3 4 5 →