ARSENIC ANTISITE DEFECTS IN ALXGA1-XAS OBSERVED BY LUMINESCENCE-DETECTED ELECTRON-SPIN RESONANCE

被引：15
|
作者：
FOCKELE, M [1 ]
MEYER, BK [1 ]
SPAETH, JM [1 ]
HEUKEN, M [1 ]
HEIME, K [1 ]
机构：
[1] UNIV DUISBURG,FACHBEREICH ELEKTROTECHN,D-4100 DUISBURG,FED REP GER
来源：
PHYSICAL REVIEW B | 1989年 / 40卷 / 03期
关键词：
D O I：
10.1103/PhysRevB.40.2001
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：2001 / 2004
页数：4
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