ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE

被引:425
作者
BINNIG, G [1 ]
GERBER, C [1 ]
STOLL, E [1 ]
ALBRECHT, TR [1 ]
QUATE, CF [1 ]
机构
[1] STANFORD UNIV,EDWARD L GINZTON LAB,STANFORD,CA 94305
来源
EUROPHYSICS LETTERS | 1987年 / 3卷 / 12期
关键词
D O I
10.1209/0295-5075/3/12/006
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1281 / 1286
页数:6
相关论文
共 21 条
[1]  
BINNIG G, 1986, IBM J RES DEV, V30, P355
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   STUDY OF GAS-GRAPHITE POTENTIAL BY MEANS OF HELIUM ATOM DIFFRACTION [J].
BOATO, G ;
CANTINI, P ;
TATAREK, R .
PHYSICAL REVIEW LETTERS, 1978, 40 (13) :887-889
[4]   IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J].
BRYANT, A ;
SMITH, DPE ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1986, 48 (13) :832-834
[5]   EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J].
DURIG, U ;
GIMZEWSKI, JK ;
POHL, DW .
PHYSICAL REVIEW LETTERS, 1986, 57 (19) :2403-2406
[6]   STUDY OF SURFACE-TOPOGRAPHY IN IMPACT-WEAR [J].
ENGEL, PA ;
MILLIS, DB .
WEAR, 1982, 75 (02) :423-442
[7]   THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J].
GOLOVCHENKO, JA .
SCIENCE, 1986, 232 (4746) :48-53
[8]   SURFACE-ROUGHNESS MEASUREMENTS OF LOW-SCATTER MIRRORS AND ROUGHNESS STANDARDS [J].
GUENTHER, KH ;
WIERER, PG ;
BENNETT, JM .
APPLIED OPTICS, 1984, 23 (21) :3820-3836
[9]  
MCCLELLAND GM, 1987, IN PRESS REV PROGR Q, V6
[10]  
NIKSCH M, IN PRESS