SURFACE-ROUGHNESS MEASUREMENTS OF LOW-SCATTER MIRRORS AND ROUGHNESS STANDARDS

被引:98
作者
GUENTHER, KH [1 ]
WIERER, PG [1 ]
BENNETT, JM [1 ]
机构
[1] USN,CTR WEAP,CHINA LAKE,CA 93555
来源
APPLIED OPTICS | 1984年 / 23卷 / 21期
关键词
D O I
10.1364/AO.23.003820
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:3820 / 3836
页数:17
相关论文
共 49 条
[1]   SCATTERING FROM INFRARED MISSILE DOMES [J].
ARCHIBALD, PC ;
BENNETT, HE .
OPTICAL ENGINEERING, 1978, 17 (06) :647-651
[2]  
ARONOWITZ F, 1971, LASER APPLICATIONS, V1, P131
[3]  
Beckmann P., 1963, SCATTERING ELECTROMA
[4]  
Bennet H.E., 1967, PHYS THIN FILMS, V4, P1
[5]   RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J].
BENNETT, HE ;
PORTEUS, JO .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) :123-+
[6]   SCATTERING CHARACTERISTICS OF OPTICAL-MATERIALS [J].
BENNETT, HE .
OPTICAL ENGINEERING, 1978, 17 (05) :480-488
[7]   STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J].
BENNETT, JM ;
DANCY, JH .
APPLIED OPTICS, 1981, 20 (10) :1785-1802
[8]   SCATTERING FROM MULTILAYER THIN-FILMS - THEORY AND EXPERIMENT [J].
BOUSQUET, P ;
FLORY, F ;
ROCHE, P .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1981, 71 (09) :1115-1123
[9]   DETERMINATION OF AUTOCORRELATION FUNCTION OF HEIGHT ON A ROUGH SURFACE FROM COHERENT-LIGHT SCATTERING [J].
CHANDLEY, PJ .
OPTICAL AND QUANTUM ELECTRONICS, 1976, 8 (04) :329-333
[10]   SURFACE-ROUGHNESS MEASUREMENTS FROM COHERENT-LIGHT SCATTERING [J].
CHANDLEY, PJ .
OPTICAL AND QUANTUM ELECTRONICS, 1976, 8 (04) :323-327