PERFORMANCE OF A SCANNING FORCE MICROSCOPE USING A LASER DIODE

被引：18
|
作者：
SARID, D
IAMS, DA
INGLE, JT
WEISSENBERGER, V
PLOETZ, J
机构：
[1] Optical Sciences Center, University of Arizona, Tucson
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期
关键词：
D O I：
10.1116/1.576400
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We demonstrate a scanning force microscope using a laser diode with a sensitivity of 3 pm per ^Hz in the vertical direction. The system, which contains no optical elements other than the laser diode and its integrated photodiode, is currently used to image magnetic domains. © 1990, American Vacuum Society. All rights reserved.
引用
收藏
页码：378 / 382
页数：5
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