EFFECTS OF OPTICAL ANISOTROPY OF AGGREGATED SILVER FILMS ON ELLIPSOMETRIC DETERMINATION OF N, K, AND D

被引：27
|
作者：
YAMAGUCHI, T
YOSHIDA, S
KINBARA, A
机构：
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1972年 / 62卷 / 05期
关键词：
D O I：
10.1364/JOSA.62.000634
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：634 / +
页数：1
相关论文
共 50 条
  • [11] CONTINUOUS ELLIPSOMETRIC DETERMINATION OF OPTICAL CONSTANTS AND THICKNESS OF A SILVER FILM DURING DEPOSITION
    YAMAGUCHI, T
    YOSHIDA, S
    KINBARA, A
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1969, 8 (05) : 559 - +
  • [12] DETERMINATION OF THE OPTICAL-CONSTANTS (N, K) OF THIN DIELECTRIC FILMS
    KHAWAJA, EE
    BOUAMRANE, F
    APPLIED OPTICS, 1993, 32 (07): : 1168 - 1172
  • [13] A method for the determination of the optical constants (n and k) of thin films with large optical inhomogeneities
    Al-Kuhaili, M. F.
    Khawaja, E. E.
    Durrani, S. M. A.
    JOURNAL OF MODERN OPTICS, 2007, 54 (10) : 1453 - 1465
  • [14] Linear dichroism and optical anisotropy of silver nanoprisms in polymer films
    Requena, S.
    Doan, H.
    Raut, S.
    D'Achille, A.
    Gryczynski, Z.
    Gryczynski, I.
    Strzhemechny, Y. M.
    NANOTECHNOLOGY, 2016, 27 (32)
  • [15] Microstructure and ellipsometric modelling of the optical properties of very thin silver films for application in plasmonics
    Todorov, R.
    Lozanova, V.
    Knotek, P.
    Cernoskova, E.
    Vlcek, M.
    THIN SOLID FILMS, 2017, 628 : 22 - 30
  • [16] DETERMINATION OF THE OPTICAL ANISOTROPY OF MAGNETIC GARNET-FILMS
    HEMME, H
    DOTSCH, H
    MIDDELBERG, J
    KAPPELT, R
    TOLKSDORF, W
    OPTICS LETTERS, 1987, 12 (11) : 947 - 949
  • [17] ELLIPSOMETRIC DETERMINATION OF THE OPTICAL-CONSTANTS OF C60 (BUCKMINSTERFULLERENE) FILMS
    REN, SL
    WANG, Y
    RAO, AM
    MCRAE, E
    HOLDEN, JM
    HAGER, T
    WANG, KA
    LEE, WT
    NI, HF
    SELEGUE, J
    EKLUND, PC
    APPLIED PHYSICS LETTERS, 1991, 59 (21) : 2678 - 2680
  • [18] PRECISION IN THE ELLIPSOMETRIC DETERMINATION OF THE OPTICAL-CONSTANTS OF VERY THIN-FILMS
    VUYE, G
    LOPEZRIOS, T
    APPLIED OPTICS, 1982, 21 (16): : 2968 - 2971
  • [19] Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method
    Evmenova, Anna Z.
    Odarych, Volodymyr A.
    Sizov, Fedir F.
    Vuichyk, Mykola V.
    OPTICA APPLICATA, 2008, 38 (03) : 585 - 600
  • [20] Comparison of ellipsometric methods for separate determination of thickness and optical constants of thin films
    Bortchagovsky, EG
    Getsko, OM
    LIGHTMETRY: METROLOGY, SPECTROSCOPY, AND TESTING TECHNIQUES USING LIGHT, 2001, 4517 : 126 - 133
12345