EFFECT OF SAMPLE IMPERFECTIONS IN WAVELENGTH-SCANNING POLARIZATION-MODULATION ELLIPSOMETRY

被引：10
作者：
BERMUDEZ, VM
机构：
来源：
OPTICS COMMUNICATIONS | 1977年 / 23卷 / 03期
关键词：
D O I：
10.1016/0030-4018(77)90395-9
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：413 / 418
页数：6
相关论文
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